Kruglov M V

Publications in Math-Net.Ru

1. Effect of the total internal reflection of X-rays on the secondary emission yield
   
   Fizika Tverdogo Tela, 28:8 (1986),  2560–2563
2. Determination of photoemission formation depth by the X-ray dynamic scattering effect technique
   
   Fizika Tverdogo Tela, 28:1 (1986),  322–324
3. Photoemission for symmetrical case of X-ray dynamical diffraction
   
   Fizika Tverdogo Tela, 27:9 (1985),  2732–2734
4. Application of energy analysis in the external photoeffect method at X-ray diffraction
   
   Fizika Tverdogo Tela, 26:3 (1984),  746–753
5. Extrinsic photoeffect at external X-ray reflection
   
   Fizika Tverdogo Tela, 26:2 (1984),  519–523
6. Photoemission and reflection in the dynamic scattering of almost parallel X-ray beams
   
   Fizika Tverdogo Tela, 25:3 (1983),  653–657