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Publications in Math-Net.Ru
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Development of the processing technique and study of microwave switches based on 4$H$-SiC $p$–$i$–$n$ diodes
Zhurnal Tekhnicheskoi Fiziki, 90:2 (2020), 264–267
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Structural, electrical, and optical properties of 4$H$-SiC for ultraviolet photodetectors
Fizika i Tekhnika Poluprovodnikov, 54:12 (2020), 1368–1373
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Characteristics of Schottky rectifier diodes based on silicon carbide at elevated temperatures
Fizika i Tekhnika Poluprovodnikov, 54:12 (2020), 1364–1367
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Influence of the proton irradiation temperature on the characteristics of high-power high-voltage silicon carbide Schottky diodes
Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:6 (2020), 35–37
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Effect of irradiation with 15-MeV protons on low frequency noise in power SiC MOSFETs
Fizika i Tekhnika Poluprovodnikov, 53:12 (2019), 1604–1608
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Radiation-induced damage of silicon-carbide diodes by high-energy particles
Fizika i Tekhnika Poluprovodnikov, 52:13 (2018), 1651–1655
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Effect of the energy of bombarding electrons on the conductivity of $n$-4$H$-SiC (CVD) epitaxial layers
Fizika i Tekhnika Poluprovodnikov, 51:3 (2017), 311–316
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A study of the effect of electron and proton irradiation on 4$H$-SiC device structures
Pisma v Zhurnal Tekhnicheskoi Fiziki, 43:22 (2017), 63–67
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Effect of the fabrication conditions of SiGe LEDs on their luminescence and electrical properties
Fizika i Tekhnika Poluprovodnikov, 50:2 (2016), 250–253
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Высокотемпературный диод Шоттки Au$-$SiC-$6H$
Fizika i Tekhnika Poluprovodnikov, 25:2 (1991), 328–333
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Связь желтой электролюминесценции в $6H$-SiC с глубокими центрами
Fizika i Tekhnika Poluprovodnikov, 24:8 (1990), 1384–1390
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Электрические характеристики и температурный коэффициент напряжения
пробоя микроплазм в низковольтных карбид-кремниевых $p{-}n$-структурах
Fizika i Tekhnika Poluprovodnikov, 24:4 (1990), 647–652
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Разновидность неклассического термоинжекционного тока
в карбид-кремниевых $p{-}n$-структурах
Fizika i Tekhnika Poluprovodnikov, 23:10 (1989), 1813–1818
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Неклассический термоинжекционный ток в карбид-кремниевых
$p{-}n$-структурах
Fizika i Tekhnika Poluprovodnikov, 23:4 (1989), 647–651
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Температурная зависимость напряжения лавинного пробоя
в карбид-кремниевых $p{-}n$-переходах
Fizika i Tekhnika Poluprovodnikov, 22:9 (1988), 1574–1579
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Электрические характеристики эпитаксиальных
$p^{+}{-}n{-}n^{+}$-структур на основе карбида кремния политипа $6H$
Fizika i Tekhnika Poluprovodnikov, 22:2 (1988), 298–300
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Formation of $Si\,C$ epitaxial R-P-structures of sublayers, obtained from volume $Si\,C$ crystals
Pisma v Zhurnal Tekhnicheskoi Fiziki, 13:19 (1987), 1168–1171
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Structures with Ionically Implanted p${-}$n Junction Based on Epitaxial $4H$-SiC with $S$-Like Current–Voltage Characteristic
Fizika i Tekhnika Poluprovodnikov, 20:9 (1986), 1654–1657
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Study of Current-Voltage Characteristics of Diode Structures Based on Silicon Carbide
Fizika i Tekhnika Poluprovodnikov, 20:5 (1986), 844–848
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Tension limitations obtained by carbide-silicon R-P-structures
Pisma v Zhurnal Tekhnicheskoi Fiziki, 12:13 (1986), 773–776
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Tunnel-diode based on $Si\,C$
Pisma v Zhurnal Tekhnicheskoi Fiziki, 11:16 (1985), 976–978
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Silicon-carbide R-P-structures produced by liquid epitaxy
Pisma v Zhurnal Tekhnicheskoi Fiziki, 11:4 (1985), 238–241
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