Korablev Vadim Vasilyvich

Publications in Math-Net.Ru

1. Study of short-range order parameters in amorphous films based on the extended fine structure in total secondary electron yield spectra
   
   Fizika Tverdogo Tela, 34:3 (1992),  979–981
2. Методика и результаты исследования кинетики поверхностной ЭДС в GaAs
   
   Fizika i Tekhnika Poluprovodnikov, 23:2 (1989),  323–327
3. Angular-resolved spectroscopy of authentic secondary electrons on low work function tungsten
   
   Fizika Tverdogo Tela, 30:7 (1988),  2112–2117
4. Effect of adsorbate structure on the manifestation of the substrate electronic structure in angularly resolved low-energy secondary electron spectra
   
   Fizika Tverdogo Tela, 30:4 (1988),  1038–1042
5. Secondary electron threshold workfunction spectrum of barium titanate
   
   Fizika Tverdogo Tela, 30:1 (1988),  286–288
6. Interrelationship between two different approaches to the description of secondary emission from single crystals
   
   Fizika Tverdogo Tela, 29:5 (1987),  1602–1604
7. Theoretical and experimental spectra of slow secondary electrons emitted at different angles to $(100)$ W
   
   Fizika Tverdogo Tela, 29:3 (1987),  702–705
8. Determination of the Rate of Semiconductor Surface Recombination by Electron Excitation
   
   Fizika i Tekhnika Poluprovodnikov, 21:5 (1987),  911–915
9. Manifestation of the band structure in the angle-resolved secondary electron spectra
   
   Fizika Tverdogo Tela, 28:9 (1986),  2648–2654
10. Orientation effects in the electron interaction with single crystals in soft X-ray excitation potential spectroscopy
    
    Fizika Tverdogo Tela, 28:7 (1986),  2196–2198
11. Determination of the electron mean free path in solids using soft-X-ray excitation potential spectroscopy
    
    Fizika Tverdogo Tela, 28:6 (1986),  1928–1931
12. The slow secondary electron distribution function in a semiconductor under electronic excitation
    
    Fizika Tverdogo Tela, 28:5 (1986),  1569–1571
13. ELECTRON-IRRADIATION EFFECT ON THE POTENTIAL OF A SEMICONDUCTOR SURFACE
    
    Zhurnal Tekhnicheskoi Fiziki, 56:11 (1986),  2231–2233
14. Effect of the Properties of Semiconductor Space-Charge Region on the Electron Secondary Emission
    
    Fizika i Tekhnika Poluprovodnikov, 20:4 (1986),  603–606
15. On the fine structure formation on the angle dependences of excitation potential spectra of single-crystalline soft-X-ray radiation
    
    Fizika Tverdogo Tela, 27:9 (1985),  2834–2835
16. Primary electron incidence angle effect on amplitude of auger-peaks and its satellites in single crystals
    
    Fizika Tverdogo Tela, 27:8 (1985),  2533–2535
17. Influence of electron incidence angle on excitation potential spectra of soft X-ray radiation of $\mathrm{V}(100)$ single crystals
    
    Fizika Tverdogo Tela, 26:7 (1984),  2198–2200
18. MODELS FOR THE PROBLEM OF PROBING POTENTIAL RELIEF BY AN ELECTRON-BEAM
    
    Zhurnal Tekhnicheskoi Fiziki, 54:6 (1984),  1198–1201
19. Orientational effect at different energy Auger-electron emission from single crystals
    
    Fizika Tverdogo Tela, 25:12 (1983),  3527–3531
20. Angular dependencies of the soft-X-ray appearance potential spectroscopy of single crystals
    
    Fizika Tverdogo Tela, 25:3 (1983),  647–652
21. Secondary-emission methods of investigating the structure and composition of the surface layers of solids
    
    UFN, 122:3 (1977),  528–529