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Publications in Math-Net.Ru
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Comparison of characteristics of thin PZT films on Si-on-sapphire and Si substrates
Fizika Tverdogo Tela, 63:8 (2021), 1076–1083
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Structural characterization of a short-period superlattice based on the CdF$_{2}$/CaF$_{2}$/Si(111) heterostructure by transmission electron microscopy and X-ray diffractometry
Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:15 (2021), 3–6
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An increase of threading dislocations filtering efficiency in AlN/$c$-Al$_{2}$O$_{3}$ templates with faceted surface morphology during a growth by molecular beam epitaxy
Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:11 (2020), 26–30
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Decreasing density of grown-in dislocations in AlN/$c$-sapphire templates grown by plasma-activated molecular beam epitaxy
Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:8 (2020), 36–39
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Effect of the sapphire-nitridation level and nucleation-layer enrichment with aluminum on the structural properties of AlN layers
Fizika i Tekhnika Poluprovodnikov, 52:6 (2018), 643–650
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Change in the character of biaxial stresses with an increase in $x$ from 0 to 0.7 in Al$_{x}$Ga$_{1-x}$N:Si layers obtained by ammonia molecular beam epitaxy
Fizika i Tekhnika Poluprovodnikov, 52:2 (2018), 233–237
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X-ray diffractometry of AlN/$c$-sapphire templates obtained by plasma-activated molecular beam epitaxy
Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:8 (2016), 61–69
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Diffuse x-ray scattering from defects in germanium-lithium single crystals
Fizika Tverdogo Tela, 28:12 (1986), 3734–3736
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MEASUREMENT OF ANGULAR-DISTRIBUTIONS OF THE X-RAY DIFFUSE-SCATTERING ON
THE TRIPLE CRYSTAL DIFFRACTOMETER WITH LAUE-CASE DIFFRACTIONS
Zhurnal Tekhnicheskoi Fiziki, 55:2 (1985), 391–393
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Experimental observation of dynamical effects at X-ray diffuse scattering
Fizika Tverdogo Tela, 26:11 (1984), 3445–3447
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Diffusion scattering distribution near Bragg reflections and its peculiarities at X-ray-diffraction by $\mathrm{Ge}$ single crystals doped with $\mathrm{As}$
Fizika Tverdogo Tela, 26:7 (1984), 2155–2158
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