Filatova Elena Olegovna

Publications in Math-Net.Ru

1. Photoluminescence of Ta$_{2}$O$_{5}$ films formed by the molecular layer deposition method
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:7 (2016),  10–16
2. Ioneda effect in the ultrasoft X-ray range
   
   Fizika Tverdogo Tela, 33:8 (1991),  2320–2325
3. X-ray spectroscopic study of the distribution of structural defects in implanted silicon
   
   Fizika Tverdogo Tela, 32:10 (1990),  2895–2898
4. Reflection spectra of $\mathrm{BN}_{hex}$ near the $K$-threshold of boron ionization
   
   Fizika Tverdogo Tela, 32:5 (1990),  1551–1554
5. Fine structure of absorption $2p$-spectra of silicon compounds
   
   Fizika Tverdogo Tela, 27:4 (1985),  997–1000
6. X-ray reflection spectra of crystalline $\alpha$-quartz and amorphous $\mathrm{SiO}_{2}$ and $\mathrm{SiO}_{x}$ films
   
   Fizika Tverdogo Tela, 27:4 (1985),  991–996
7. Spectral behavior of refractive index unit decrement of $\mathrm{Si}$ and its compounds at ionization $\mathrm{Sil}_{2,3}$-threshold
   
   Fizika Tverdogo Tela, 27:3 (1985),  907–909
8. X-ray reflection spectra and optical constants of $\mathrm{SiC}$ and $\mathrm{Si}_{3}\mathrm{N}_{4}$
   
   Fizika Tverdogo Tela, 27:3 (1985),  678–681
9. Optical constants of silicon single crystals in the $70$–$400$ eV region
   
   Fizika Tverdogo Tela, 25:5 (1983),  1280–1285
10. Fine structure of silicon compound reflection spectra in a region of $\mathrm{SiL}_{2,3}$-ionisation threshold
    
    Fizika Tverdogo Tela, 25:4 (1983),  1120–1123