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Barashev M N
Publications in Math-Net.Ru
X-ray diffraction study of distorted surface layers of
$\mathrm{Si} (111)$
and $\mathrm{In}_{0.5}\mathrm{Ga}_{0.5}\mathrm{P}/\mathrm{GaAs} (111)$ basing on the constant strain gradient model
Fizika Tverdogo Tela
,
31
:4 (1989),
74–81
©
Steklov Math. Inst. of RAS
, 2024
