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Publications in Math-Net.Ru
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Pulsed laser irradiation of light-emitting structures with a (Ga,Mn)As layer
Fizika Tverdogo Tela, 63:9 (2021), 1245–1252
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Diode heterostructures with narrow-gap ferromagnetic A$^{3}$FeB$^{5}$ semiconductors of various conduction type
Fizika Tverdogo Tela, 63:7 (2021), 866–873
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Action of excimer laser pulses on light-emitting InGaAs/GaAs structures with a (Ga,Mn)As-layer
Fizika Tverdogo Tela, 63:3 (2021), 346–355
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Effect of ion irradiation on the magnetic properties of CoPt films
Fizika Tverdogo Tela, 63:3 (2021), 324–332
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Diode heterostructures with a ferromagnetic (Ga, Mn)As layer
Fizika Tverdogo Tela, 62:3 (2020), 373–380
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Pulsed laser irradiation of GaAs-based light-emitting structures
Fizika i Tekhnika Poluprovodnikov, 54:12 (2020), 1336–1343
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Modifying the magnetic properties of the CoPt alloy by ion irradiation
Fizika Tverdogo Tela, 61:9 (2019), 1694–1699
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Studying magnetic diodes with a GaMnAs layer formed by pulsed laser deposition
Fizika i Tekhnika Poluprovodnikov, 53:3 (2019), 351–358
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Detectors of circularly polarized radiation based on semiconductor heterostructures with a CoPt Schottky barrier
Fizika Tverdogo Tela, 60:11 (2018), 2236–2239
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The effect of the composition of a carrier gas during the growth of a Mn delta-layer on the electrical and magnetic properties of GaAs structures
Fizika i Tekhnika Poluprovodnikov, 52:11 (2018), 1286–1290
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Photoconductive detector of circularly polarized radiation based on a MIS structure with a CoPt layer
Fizika Tverdogo Tela, 59:11 (2017), 2203–2205
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Emitting heterostructures with a bilayer InGaAs/GaAsSb/GaAs quantum well and a GaMnAs ferromagnetic layer
Fizika Tverdogo Tela, 59:11 (2017), 2196–2199
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Features of the selective manganese doping of GaAs structures
Fizika i Tekhnika Poluprovodnikov, 51:11 (2017), 1468–1472
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Effect of thermal annealing on the photoluminescence of structures with InGaAs/GaAs quantum wells and a low-temperature GaAs layer $\delta$-doped with Mn
Fizika i Tekhnika Poluprovodnikov, 50:11 (2016), 1490–1496
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GaAs structures with a gate dielectric based on aluminum-oxide layers
Fizika i Tekhnika Poluprovodnikov, 50:2 (2016), 204–207
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