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Publications in Math-Net.Ru
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Self-organization of the composition of Al$_{x}$Ga$_{1-x}$N films grown on hybrid SiC/Si substrates
Fizika Tverdogo Tela, 63:3 (2021), 363–369
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Mechanical properties of a composite SiC coating on graphite obtained by the atomic substitution method
Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:20 (2021), 7–10
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A light-emitting diode based on alingan heterostructures grown on SiC/Si substrates and its fabrication technology
Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:18 (2021), 3–6
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Peculiarities of epitaxial growth of III – N led heterostructures on SiC/Si substrates
Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:15 (2021), 15–18
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Mechanical properties of epilayers of metastable $\alpha$- and $\varepsilon$-Ga$_{2}$O$_{3}$ phases studied by nanoindentation
Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:14 (2021), 3–7
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Coating of nanostructured profiled Si surface with a SiC layer
Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:20 (2020), 19–22
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Investigation of the hardness and Young's modulus in thin near-surface layers of silicon carbide from the Si- and C-faces by nanoindentation
Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:15 (2020), 36–38
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Study of elastic properties of SiC films synthesized on Si substrates by the method of atomic substitution
Fizika Tverdogo Tela, 61:12 (2019), 2313–2315
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Studying evolution of the ensemble of micropores in a SiC/Si structure during its growth by the method of atom substitution
Fizika Tverdogo Tela, 61:3 (2019), 433–440
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Photoelectric properties of GaN layers grown by plasma-assisted molecular-beam epitaxy on Si(111) substrates and SiC/Si(111) epitaxial layers
Fizika i Tekhnika Poluprovodnikov, 53:2 (2019), 190–198
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Growing III–V semiconductor heterostructures on SiC/Si substrates
Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:14 (2019), 24–27
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Study of the anisotropic elastoplastic properties of $\beta$-Ga$_{2}$O$_{3}$ films synthesized on SiC/Si substrates
Fizika Tverdogo Tela, 60:5 (2018), 851–856
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Photoelectric characteristics of silicon carbide–silicon structures grown by the atomic substitution method in a silicon crystal lattice
Fizika i Tekhnika Poluprovodnikov, 51:5 (2017), 651–658
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