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Publications in Math-Net.Ru
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High-voltage 4$H$-SiC based avalanche diodes with a negative beve
Fizika i Tekhnika Poluprovodnikov, 55:4 (2021), 349–353
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TCAD simulation of high-voltage 4$H$-SiC diodes with an edge semi-insulating region
Fizika i Tekhnika Poluprovodnikov, 55:2 (2021), 201–206
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High-voltage 4$H$-SiC Schottky diodes with field-plate edge termination
Fizika i Tekhnika Poluprovodnikov, 55:2 (2021), 188–194
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High-voltage avalanche 4$H$-SiC diodes with a protective semi-insulating area
Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:6 (2021), 48–50
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Avalanche breakdown in 4$H$-SiC Schottky diodes: reliability aspects
Zhurnal Tekhnicheskoi Fiziki, 90:12 (2020), 2133–2138
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Formation of SiC mesastructures with gently sloping sidewalls by dry selective etching through a photoresist mask
Zhurnal Tekhnicheskoi Fiziki, 90:6 (2020), 997–1000
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Edge-termination technique for high-voltage mesa-structure 4$H$-SiC devices: negative beveling
Fizika i Tekhnika Poluprovodnikov, 54:2 (2020), 207–211
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Micro-profiling of 4$H$-SiC by dry etching to form a Schottky barrier diode
Fizika i Tekhnika Poluprovodnikov, 54:1 (2020), 97–102
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