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Panov Mikhail Fedorovich

Publications in Math-Net.Ru

  1. Determination of thickness in silicon carbide structures by frequency analysis of the reflection spectrum

    Zhurnal Tekhnicheskoi Fiziki, 91:5 (2021),  827–831
  2. Comparative ellipsometric analysis of silicon carbide polytypes 4$H$, 15$R$, and 6$H$ produced by a modified Lely method in the same growth process

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:19 (2020),  28–31
  3. Investigation of the hardness and Young's modulus in thin near-surface layers of silicon carbide from the Si- and C-faces by nanoindentation

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:15 (2020),  36–38
  4. Nondestructive control of the surface, layers, and charge carrier concentration on SiC substrates and structures

    Zhurnal Tekhnicheskoi Fiziki, 89:12 (2019),  1869–1874
  5. Planarization of a surface of nanoporous silica–titania composition by atomic-molecular chemical assembly

    Zhurnal Tekhnicheskoi Fiziki, 87:5 (2017),  736–740


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