Publications in Math-Net.Ru
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Determination of thickness in silicon carbide structures by frequency analysis of the reflection spectrum
Zhurnal Tekhnicheskoi Fiziki, 91:5 (2021), 827–831
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Comparative ellipsometric analysis of silicon carbide polytypes 4$H$, 15$R$, and 6$H$ produced by a modified Lely method in the same growth process
Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:19 (2020), 28–31
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Investigation of the hardness and Young's modulus in thin near-surface layers of silicon carbide from the Si- and C-faces by nanoindentation
Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:15 (2020), 36–38
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Nondestructive control of the surface, layers, and charge carrier concentration on SiC substrates and structures
Zhurnal Tekhnicheskoi Fiziki, 89:12 (2019), 1869–1874
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Planarization of a surface of nanoporous silica–titania composition by atomic-molecular chemical assembly
Zhurnal Tekhnicheskoi Fiziki, 87:5 (2017), 736–740
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