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Zhulkov Maxim Olegovich
Publications in Math-Net.Ru
Dependence of mechanical and tribological properties of
$\alpha$
-C : H : SiO
$_{x}$
films on the bias voltage amplitude of the substrate
Zhurnal Tekhnicheskoi Fiziki
,
91
:8 (2021),
1286–1292
©
Steklov Math. Inst. of RAS
, 2024