Abdikarimov A E

Publications in Math-Net.Ru

1. The influence of a single charged interface trap on the subthreshold drain current in FinFETs with different fin shapes
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:10 (2020),  34–37
2. The effect of the fin shape and thickness of the buried oxide on the DIBL effect in an SOI FinFET
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 44:21 (2018),  22–29