Publications in Math-Net.Ru
-
Comparative ellipsometric analysis of silicon carbide polytypes 4$H$, 15$R$, and 6$H$ produced by a modified Lely method in the same growth process
Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:19 (2020), 28–31
-
Investigation of the hardness and Young's modulus in thin near-surface layers of silicon carbide from the Si- and C-faces by nanoindentation
Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:15 (2020), 36–38
-
Nondestructive control of the surface, layers, and charge carrier concentration on SiC substrates and structures
Zhurnal Tekhnicheskoi Fiziki, 89:12 (2019), 1869–1874
© , 2024