|
|
Publications in Math-Net.Ru
-
Creation and investigation of metal–dielectric–semiconductor structures based on ferroelectric films
Fizika Tverdogo Tela, 62:3 (2020), 422–426
-
Conductivity of metal–dielectric–semiconductor structures based on ferroelectric films
Fizika Tverdogo Tela, 62:1 (2020), 121–124
-
Dependence of the electrophysical characteristics of metal–ferroelectric–semiconductor structures on the field-electrode material
Fizika i Tekhnika Poluprovodnikov, 54:11 (2020), 1219–1223
-
Ion-beam and X-ray methods of elemental diagnostics of thin film coatings
Fizika Tverdogo Tela, 61:12 (2019), 2454–2460
-
The effect of synthesis temperature on the microstructure and electrophysical properties of BST 80/20 films
Fizika Tverdogo Tela, 61:10 (2019), 1948–1952
-
The influence of the substrate material on the structure and electrophysical properties of Ba$_{x}$Sr$_{1-x}$TiO$_{3}$ thin films
Fizika Tverdogo Tela, 60:5 (2018), 951–954
-
Calculation of thermal parameters and technology of formation MPL microwave range
Izv. Sarat. Univ. Physics, 13:1 (2013), 9–12
-
Voltage-capacitance characteristics of MFS-structures based on ferroelectric films
Izv. Sarat. Univ. Physics, 13:1 (2013), 7–9
-
Determining parameters of planar capacitors based of thin film ferroelectric materials
Izv. Sarat. Univ. Physics, 12:2 (2012), 8–11
© , 2024