Jech M

Publications in Math-Net.Ru

1. Impact of the device geometric parameters on hot-carrier degradation in FinFETs
   
   Fizika i Tekhnika Poluprovodnikov, 52:13 (2018),  1631–1635
2. Analysis of the features of hot-carrier degradation in FinFETs
   
   Fizika i Tekhnika Poluprovodnikov, 52:10 (2018),  1177–1182
3. Physical principles of self-consistent simulation of the generation of interface states and the transport of hot charge carriers in field-effect transistors based on metal–oxide–semiconductor structures
   
   Fizika i Tekhnika Poluprovodnikov, 52:2 (2018),  254–259