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Publications in Math-Net.Ru

  1. Impact of the device geometric parameters on hot-carrier degradation in FinFETs

    Fizika i Tekhnika Poluprovodnikov, 52:13 (2018),  1631–1635
  2. Analysis of the features of hot-carrier degradation in FinFETs

    Fizika i Tekhnika Poluprovodnikov, 52:10 (2018),  1177–1182


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