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Publications in Math-Net.Ru
Impact of the device geometric parameters on hot-carrier degradation in FinFETs
Fizika i Tekhnika Poluprovodnikov
,
52
:13 (2018),
1631–1635
Analysis of the features of hot-carrier degradation in FinFETs
Fizika i Tekhnika Poluprovodnikov
,
52
:10 (2018),
1177–1182
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Steklov Math. Inst. of RAS
, 2024