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Vatuev Aleksandr Sergeevich
Publications in Math-Net.Ru
Comparative analysis of breakdown mechanism in thin SiO
$_2$
oxide films in metal–oxide–semiconductor structures under the action of heavy charged particles and a pulsed voltage
Zhurnal Tekhnicheskoi Fiziki
,
86
:2 (2016),
30–36
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Steklov Math. Inst. of RAS
, 2024