RUS
ENG
Full version
PEOPLE
Kryukov Evgenii Vital'evich
Publications in Math-Net.Ru
Extremely deep profiling analysis of the atomic composition of thick (
$>$
100
$\mu$
m) GaAs layers within power PIN diodes by secondary ion mass spectrometry
Pisma v Zhurnal Tekhnicheskoi Fiziki
,
42
:15 (2016),
27–35
©
Steklov Math. Inst. of RAS
, 2024
