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Reflection High-Energy Electron Diffraction observation of graphene layer formation on 6
H
-SiC Substrate
Fizika i Tekhnika Poluprovodnikov
,
59
:2 (2025),
102–108
The electrochemical profiling of
$n^+/n$
GaAs structures for field-effect transistors
Fizika i Tekhnika Poluprovodnikov
,
58
:1 (2024),
53–61
InSb/GaAs heterostructures for magnetic field sensors
Pisma v Zhurnal Tekhnicheskoi Fiziki
,
49
:20 (2023),
27–30
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Steklov Math. Inst. of RAS
, 2025