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Ponkratov Dmitrii Vasil'evich

Publications in Math-Net.Ru

  1. Maximizing the sensitivity of thin film metal-dielectric refractometers

    Optics and Spectroscopy, 133:8 (2025),  896–906
  2. Optical characteristics of boron-doped silicon wafers after rapid thermal annealing

    Optics and Spectroscopy, 133:8 (2025),  874–880
  3. Fourier analysis of modes of microstructured optical fibers

    Zhurnal Tekhnicheskoi Fiziki, 92:12 (2022),  1898–1908


© Steklov Math. Inst. of RAS, 2025