Zakharov Nikolai Dmitrievich

Publications in Math-Net.Ru

1. Use of related parameters in X-ray diffraction analysis of multilayer structures with allowance for the layer growth time
   
   Zhurnal Tekhnicheskoi Fiziki, 84:3 (2014),  94–98
2. A new approach to the diagnostics of nanoislands in Ge$_x$Si$_{1-x}$/Si heterostructures by secondary ion mass spectrometry
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 40:14 (2014),  36–46