Matrosova Anzhela Yur'evna

Publications in Math-Net.Ru

1. Constructing a sequence detecting robustly testable path delay faults in sequential circuits
   
   Avtomat. i Telemekh., 2021, no. 11,  148–168
2. Masking of internal nodes faults based on applying of incompletely specified Boolean functions
   
   Izv. Saratov Univ. Math. Mech. Inform., 20:4 (2020),  517–526
3. Partially programmable circuit design oriented to masking Trojan circuits
   
   Proceedings of ISP RAS, 29:5 (2017),  61–74
4. Properties of pairs of test vectors detecting path delay faults in high performance VLSI logical circuits
   
   Avtomat. i Telemekh., 2015, no. 4,  135–148
5. Detection of false paths in logical circuits by joint analysis of the AND/OR trees and SSBDD-graphs
   
   Avtomat. i Telemekh., 2013, no. 7,  126–142
6. Path delay fault test design for circuits obtained by covering ROBDDs with CLBs
   
   Prikl. Diskr. Mat., 2009, no. supplement № 1,  69–70
7. Path delay fault classification
   
   Prikl. Diskr. Mat., 2009, no. supplement № 1,  68–69
8. Path delay and multiple stuck-at fault test design for circuits derived from irredundant systems with factorized synthesis method
   
   Prikl. Diskr. Mat., 2009, no. supplement № 1,  65–66
9. Construction of the tests of combinational circuit failures by analyzing the orthogonal disjunctive normal forms represented by the alternative graphs
   
   Avtomat. i Telemekh., 2005, no. 2,  158–174
10. Self-Testing Automaton Networks: Their Design in Programmable Logical Matrices
    
    Avtomat. i Telemekh., 2002, no. 10,  120–136
11. Synthesizing testable combinational circuits
    
    Avtomat. i Telemekh., 1999, no. 2,  129–137
12. Ring Technology of Self-Testing for Hard-to-Detect Failures
    
    Avtomat. i Telemekh., 1996, no. 12,  155–163
13. On a probabilistic simulation of discrete devices
    
    Avtomat. i Telemekh., 1995, no. 3,  156–164
14. On a probability approach to computing estimates of controllability and observability of a node of a discrete device
    
    Avtomat. i Telemekh., 1993, no. 11,  152–160
15. Design of testable automaton networks
    
    Avtomat. i Telemekh., 1991, no. 3,  143–152
16. Seven-valued modeling of dead-beat automata
    
    Avtomat. i Telemekh., 1986, no. 3,  153–163
17. Constructing tests for networks of integrated circuits
    
    Avtomat. i Telemekh., 1985, no. 10,  132–143
18. Design and use of a single-step functional model of a dead-beat automaton
    
    Avtomat. i Telemekh., 1984, no. 5,  117–124
19. Investigating a dead beat automaton functional model which recognizes structural hazards
    
    Avtomat. i Telemekh., 1982, no. 4,  94–104
20. Design of a set of maximally stable states for a dead-beat automaton
    
    Avtomat. i Telemekh., 1982, no. 2,  67–74
21. On a probabilistic approach tо testing of sequential devices
    
    Avtomat. i Telemekh., 1980, no. 1,  97–102
22. A fault-detection method for a synchronous device
    
    Avtomat. i Telemekh., 1977, no. 12,  128–137