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Publications in Math-Net.Ru
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On the X-ray reflectometry technique of the structure determination of Langmuir–Blodgett films with a small amount of layers
Dokl. Akad. Nauk SSSR, 320:2 (1991), 334–338
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Structure of Langmuir–Blodgett films with alternating layers of molecules of two types from the data of X-xay small-angle scattering and electron diffraction study
Dokl. Akad. Nauk SSSR, 295:2 (1987), 373–377
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Production and structure of Langmuir films
UFN, 152:4 (1987), 698–701
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A direct method of the interpretation of data of small angle
scattering by systems of identical particles
Dokl. Akad. Nauk SSSR, 261:4 (1981), 879–882
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Construction of a catalase model based on data of X-ray small-angle scattering
Dokl. Akad. Nauk SSSR, 207:6 (1972), 1336–1339
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X-Ray method for determination of the spacing between heavy atoms in macromolecules in solution, and its application
for the investigation of gramicidin $\mathrm{C}$ derivatives
Dokl. Akad. Nauk SSSR, 190:3 (1970), 574–577
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Dispersion structure of finely ground graphite investigated by scattering X-rays at small angles
Dokl. Akad. Nauk SSSR, 161:2 (1965), 395–398
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The influence of adsorption layers on the dispersion of graphite
Dokl. Akad. Nauk SSSR, 115:5 (1957), 946–948
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On complete X-ray dispersion study of graphite powders and colloid preparations
Dokl. Akad. Nauk SSSR, 113:5 (1957), 1102–1105
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Mikhail Valentinovich Kovalchuk (on his 70th birthday)
UFN, 186:9 (2016), 1025–1026
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Mikhail Valentinovich Koval'chuk (on his sixtieth birthday)
UFN, 176:10 (2006), 1133–1134
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Boris Konstantinovich Vainshtein (on his seventieth birthday)
UFN, 161:7 (1991), 205–207
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Boris Konstantinovich Vainshtein (on his sixtieth birthday)
UFN, 134:3 (1981), 557–559
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