Yarmolik Vyacheslav Nikolaevich

Publications in Math-Net.Ru

1. Synthesis of test sequences with a given switching activity
   
   Avtomat. i Telemekh., 2022, no. 2,  154–168
2. The repeated nondestructive march tests with variable address sequences
   
   Avtomat. i Telemekh., 2007, no. 4,  126–137
3. Pseudorandom test pattern generators for built-in self-testing: a power reduction method
   
   Avtomat. i Telemekh., 2004, no. 8,  102–114
4. Nondestructive RAM Testing by Analyzing the Output Data for Symmetry
   
   Avtomat. i Telemekh., 2003, no. 9,  141–154
5. Iddq testing-based diagnosis of faults in CMOS-circuits
   
   Avtomat. i Telemekh., 1999, no. 7,  142–153
6. Nondestructive testing of memory elements by built-in parity-check facilities
   
   Avtomat. i Telemekh., 1999, no. 2,  120–128
7. IDDQ testing technology for one-dimensional iterative logic arrays
   
   Avtomat. i Telemekh., 1999, no. 1,  148–158
8. Built-in self-test scanners for very large-scale integration: a new design approach
   
   Avtomat. i Telemekh., 1998, no. 7,  157–167
9. Converter Synthesis of Pseudorandom Codes for Self-Testing of Digital Devices Satisfying the IEEE Standards
   
   Avtomat. i Telemekh., 1996, no. 4,  148–154
10. Synthesis of transformers of pseudorandom codes for testing digital schemes
    
    Avtomat. i Telemekh., 1994, no. 10,  151–157
11. Choice of optimal multiparametric probability distributions of input variables for probabilistic testing of digital circuits
    
    Avtomat. i Telemekh., 1994, no. 4,  144–150
12. Boundary scan and its application to the testing of digital devices
    
    Avtomat. i Telemekh., 1994, no. 1,  3–31
13. Calculation of signatures of regular periodic sequences
    
    Avtomat. i Telemekh., 1992, no. 1,  146–155
14. Analysis of General Purpose Unit in Organizing of VLSI Self-diagnostics
    
    Avtomat. i Telemekh., 1991, no. 1,  105–112
15. Synthesis of a signature analyzer for two-level combinational circuits
    
    Avtomat. i Telemekh., 1990, no. 4,  155–160
16. Analysis of signature testing of digital circuits
    
    Avtomat. i Telemekh., 1989, no. 10,  159–167
17. On credibility of compact testing methods
    
    Avtomat. i Telemekh., 1989, no. 9,  160–166
18. Design of pseudo-random test sequence generators
    
    Avtomat. i Telemekh., 1988, no. 9,  119–125
19. Design of Multi-Channel Signature Analyzers
    
    Avtomat. i Telemekh., 1985, no. 1,  127–132
20. Designing generators of pseudorandom sequences of test signals
    
    Avtomat. i Telemekh., 1983, no. 6,  155–162


21. Controlled random tests
    
    Avtomat. i Telemekh., 2012, no. 10,  142–155