Yanushkevich A I

Publications in Math-Net.Ru

1. Iddq testing-based diagnosis of faults in CMOS-circuits
   
   Avtomat. i Telemekh., 1999, no. 7,  142–153
2. Nondestructive testing of memory elements by built-in parity-check facilities
   
   Avtomat. i Telemekh., 1999, no. 2,  120–128
3. IDDQ testing technology for one-dimensional iterative logic arrays
   
   Avtomat. i Telemekh., 1999, no. 1,  148–158