Zakrevskiy L A

Publications in Math-Net.Ru

1. Nondestructive testing of memory elements by built-in parity-check facilities
   
   Avtomat. i Telemekh., 1999, no. 2,  120–128
2. Choice of optimal multiparametric probability distributions of input variables for probabilistic testing of digital circuits
   
   Avtomat. i Telemekh., 1994, no. 4,  144–150
3. Boundary scan and its application to the testing of digital devices
   
   Avtomat. i Telemekh., 1994, no. 1,  3–31