Malyshenko Yu V

Publications in Math-Net.Ru

1. Test Completeness Evaluation in the Presence of Analog Controllable Parameters
   
   Avtomat. i Telemekh., 1996, no. 7,  179–189
2. Functional fault models for analog circuit elements
   
   Avtomat. i Telemekh., 1992, no. 2,  136–144
3. Evaluation and Minimization of Diagnostic Information in Analog Device Troubleshooting
   
   Avtomat. i Telemekh., 1985, no. 9,  144–149
4. Racing conditions in analog combinational circuits composed of adders and multipliers
   
   Avtomat. i Telemekh., 1985, no. 8,  150–160
5. Determining the set of suspected faults from the data of modeling a working device
   
   Avtomat. i Telemekh., 1983, no. 6,  148–154
6. Choosing t h e tolerances of the parameter in checking the operability of an analog device with a list of admissible faults
   
   Avtomat. i Telemekh., 1982, no. 1,  167–171
7. Determining the siting of a specified number of test points with due regard for possible uncertainty in signal values
   
   Avtomat. i Telemekh., 1978, no. 7,  146–152
8. A checking test design algorithm for a linear d.c. system
   
   Avtomat. i Telemekh., 1978, no. 5,  135–140
9. A method for reducing the amount of diagnostic data for troubleshooting
   
   Avtomat. i Telemekh., 1977, no. 4,  160–164
10. Determining the locus of a specified number of additional test points
    
    Avtomat. i Telemekh., 1976, no. 6,  147–151