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Ivashkevich I V
Publications in Math-Net.Ru
Optical characteristics of strontium titanate films obtained by the sol–gel method
Optics and Spectroscopy
,
125
:4 (2018),
473–478
Ellipsometry of the transitive layers semiconductor–dielectric
PFMT
, 2013, no. 2(15),
18–24
The account of influence of the natural surface layer under investigation of silicon plates by the method of spectral ellipsometry
PFMT
, 2012, no. 1(10),
26–30
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Steklov Math. Inst. of RAS
, 2024