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Publications in Math-Net.Ru
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Efficiency of activated nano-heterojunctions on silicon and silicon carbide substrates
Comp. nanotechnol., 10:4 (2023), 91–102
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Efficiency determination problems for SiC*/Si microstructures and contact formation
Comp. nanotechnol., 8:3 (2021), 59–68
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Structural and optical properties of silicon-carbide nanowires produced by the high-temperature carbonization of silicon nanostructures
Fizika i Tekhnika Poluprovodnikov, 51:3 (2017), 421–425
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Associates of dot defects of various nature in $\mathrm{SiC}$-phase of semiconductor heterostructure of $\mathrm{SiC//Si}$, received by endotaksiya method
Vestnik Samarskogo Gosudarstvennogo Universiteta. Estestvenno-Nauchnaya Seriya, 2014, no. 7(118), 145–162
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Distribution of point defects in the Si-faze including Sic-faze, formed by endotaxe method of semiconductor heterostructures
Vestnik Samarskogo Gosudarstvennogo Universiteta. Estestvenno-Nauchnaya Seriya, 2012, no. 9(100), 164–179
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Peculiarities of nanopoint damage process in the structure of por-SiC/Si, obtained by diffusion technology for chemical sensors
Vestnik Samarskogo Gosudarstvennogo Universiteta. Estestvenno-Nauchnaya Seriya, 2011, no. 2(83), 179–183
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