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Rogachev Aleksandr Aleksandrovich

Publications in Math-Net.Ru

  1. Molecular structure and anti-fungicidal properties of coatings based on clotrimazole and polymers formed from the active gas phase

    PFMT, 2024, no. 1(58),  50–56
  2. Synthesis and sorption properties of coatings based on hydroxyethyl cellulose intercalated from the gas phase with antibacterial compounds

    PFMT, 2023, no. 4(57),  53–59
  3. Features of polymer materials degradation under influence of short-wave laser radiation

    PFMT, 2022, no. 1(50),  49–54
  4. Features of electron-beam synthesis and electrophysical properties of hybrid coatings based on polyaniline and zinc oxide

    PFMT, 2022, no. 1(50),  37–43
  5. Radiation resistance of metal-alloyed organosilicon coatings deposited from the gas phase

    PFMT, 2021, no. 2(47),  45–50
  6. Bioactive multilayer coatings that initiate bone growth: structure and properties

    PFMT, 2019, no. 2(39),  28–35
  7. Molecular structure of single-layer and bi-layer coatings, which are perspective when used in osteosynthesis processes

    PFMT, 2019, no. 2(39),  21–27
  8. Phase composition and structure of multilayer nanosized metal-carbon coatings

    PFMT, 2018, no. 2(35),  34–37
  9. The impact of technological processes on the properties of polymer-based coatings deposited from active gas phase (Review). 2. Influence of conditions and parameters of the processes proceeding on the deposited surface

    PFMT, 2016, no. 4(29),  35–40
  10. Influence of technological processes of forming on the properties of coatings based on polymers deposited from active gas phase (review). 1. Effect of conditions and modes of gas phase generation

    PFMT, 2016, no. 2(27),  29–38
  11. Influence of assisting laser radiation at electron-beam dispersion on the molecular structure of polyethylene-silver nanocomposite coatings

    PFMT, 2013, no. 1(14),  37–42
  12. Kinetic characteristics of dispersion of organosilicon compounds in vacuum and molecular structure of the coatings, deposited from volatile products of dispersion

    PFMT, 2011, no. 3(8),  32–38
  13. Molecular structure and morphology of surface layers of polyimide-fluoropolymer film treated by glow discharge plasma

    PFMT, 2011, no. 1(6),  40–47
  14. Molecular structure and morphology of the polyethylene coatings alloyed when forming from gas phase by low-molecular compound

    PFMT, 2010, no. 2(3),  10–20
  15. Molecular architecture of nanocomposite polytetrafluoroethylene and metal based coatings formed from active gas phase

    PFMT, 2009, no. 1(1),  21–26
  16. SILICON AUGER-TRANSISTOR WITH TUNNEL MOS-EMITTER

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 17:13 (1991),  44–48
  17. MAGNETIC-PROPERTIES OF EXCITONS BONDED TO A SURFACE-CHARGE LAYER IN SILICONE

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 15:4 (1989),  17–21
  18. TWO-DIMENSIONAL ELECTRON-HOLE PLASMA ON THE GALLIUM ARSENIDE-ELECTROLYTE INTERPHASE BOUNDARY

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 14:23 (1988),  2183–2187
  19. CUMULATION OF PHOTOFLOW IN THE N-N GASB-GAINASSB ISOTOPIC STRUCTURE

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 14:5 (1988),  389–393
  20. Diamagnetism of two-dimensional electron-hole plasma on the germanium surface

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 13:18 (1987),  1113–1117
  21. Polarization of emission in quantum dimensional on one heterotransition

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 13:6 (1987),  332–337
  22. Generation of Coherent Radiation in Quantum-Dimensional Structure on the Single Heterojunction

    Fizika i Tekhnika Poluprovodnikov, 20:12 (1986),  2217–2221
  23. Photoluminescence of highly alloyed crystals of $n$-type indium-antimonide

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 11:21 (1985),  1326–1330
  24. Circular Photogalvanic Effect in Tellurium. II. Experiment

    Fizika i Tekhnika Poluprovodnikov, 18:4 (1984),  648–654
  25. Circular Photogalvanic Effect in Tellurium. I. Theory

    Fizika i Tekhnika Poluprovodnikov, 18:4 (1984),  639–647
  26. X-RAY-DIFFRACTION ON THE PLASTIC DEFORMED EPITAXIAL HETEROSTRUCTURES

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 10:21 (1984),  1297–1301


© Steklov Math. Inst. of RAS, 2024