Popkov Kirill Andreevich

Publications in Math-Net.Ru

1. Letter to the Editors
   
   Diskr. Mat., 36:3 (2024),  149
2. Implementation of Linear Boolean Functions by Self-Correcting Circuits of Unreliable Logic Gates
   
   Mat. Zametki, 115:1 (2024),  91–107
3. Short tests for contact circuits under one-type weakly connected faults of contacts
   
   Diskr. Mat., 35:4 (2023),  69–78
4. Short Complete Diagnostic Tests for Circuits Implementing Linear Boolean Functions
   
   Mat. Zametki, 113:1 (2023),  75–89
5. Short fault detection tests for contact circuits under arbitrary weakly connected faults of contacts
   
   Prikl. Diskr. Mat., 2023, no. 62,  71–82
6. Short conditional complete diagnostic tests for circuits under one-type constant faults of gates
   
   Diskr. Mat., 34:3 (2022),  63–69
7. Short complete diagnostic tests for circuits with two additional inputs in some basis
   
   Diskr. Mat., 34:2 (2022),  67–82
8. On Self-Correcting Logic Circuits of Unreliable Gates with at Most Two Inputs
   
   Mat. Zametki, 111:1 (2022),  145–148
9. Short complete diagnostic tests for circuits with one additional input in the standard basis
   
   Prikl. Diskr. Mat., 2022, no. 56,  104–112
10. Short single fault detection tests for logic networks under arbitrary faults of gates
    
    Prikl. Diskr. Mat., 2022, no. 55,  59–76
11. Short complete diagnostic tests for logic circuits in one infinite basis
    
    Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2022, no. 5,  51–54
12. On implementation of Boolean functions by contact circuits of minimal uniform width
    
    Diskr. Mat., 33:4 (2021),  94–109
13. On self-correcting logic circuits of unreliable gates
    
    Keldysh Institute preprints, 2021, 049, 18 pp.
14. On logic networks allowing short single fault detection tests under arbitrary faults of gates
    
    Prikl. Diskr. Mat., 2021, no. 51,  85–100
15. On implementation of boolean functions by contact circuits with a constant uniform width
    
    Dokl. RAN. Math. Inf. Proc. Upr., 495 (2020),  65–68
16. Bounds on Shannon functions of lengths of contact closure tests for contact circuits
    
    Diskr. Mat., 32:3 (2020),  49–67
17. Short single diagnostic tests for contact circuits under breaks and closures of contacts
    
    Intelligent systems. Theory and applications, 24:1 (2020),  143–152
18. Short Tests of Closures for Contact Circuits
    
    Mat. Zametki, 107:4 (2020),  591–603
19. On the implementation of Boolean functions by contact circuits with uniform width 3
    
    Uchenye Zapiski Kazanskogo Universiteta. Seriya Fiziko-Matematicheskie Nauki, 162:3 (2020),  350–358
20. Short complete fault detection tests for logic networks with fan-in two
    
    Diskretn. Anal. Issled. Oper., 26:1 (2019),  89–113
21. On diagnostic tests of contact break for contact circuits
    
    Diskr. Mat., 31:2 (2019),  123–142
22. A method of construction of easily diagnosable logic networks regarding single faults
    
    Keldysh Institute preprints, 2019, 081, 29 pp.
23. Short single fault detection tests for contact circuits under breaks and closures of contacts
    
    Intelligent systems. Theory and applications, 23:3 (2019),  97–130
24. On complete diagnostic tests for contact diagrams during opening and/or closing of contacts
    
    University proceedings. Volga region. Physical and mathematical sciences, 2019, no. 3,  5–24
25. A method for constructing logic networks allowing short single diagnostic tests
    
    Prikl. Diskr. Mat., 2019, no. 46,  38–57
26. Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates
    
    Prikl. Diskr. Mat., 2019, no. 43,  78–100
27. Minimal complete fault detection tests for circuits of functional elements in the standard basis
    
    Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2019, no. 4,  54–57
28. Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates
    
    Diskretn. Anal. Issled. Oper., 25:2 (2018),  62–81
29. Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
    
    Diskr. Mat., 30:3 (2018),  99–116
30. On diagnostic tests of contact break for contact circuits
    
    Keldysh Institute preprints, 2018, 271, 24 pp.
31. Short complete fault detection tests for logic networks with fan-in two
    
    Keldysh Institute preprints, 2018, 197, 24 pp.
32. Minimal complete fault detection tests for logic networks in the standard basis
    
    Keldysh Institute preprints, 2018, 161, 7 pp.
33. Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates
    
    Keldysh Institute preprints, 2018, 149, 32 pp.
34. Synthesis of easily testable logic networks under one-type stuck-at faults at inputs and outputs of gates
    
    Keldysh Institute preprints, 2018, 087, 18 pp.
35. Short single tests for logic networks under arbitrary stuck-at faults at outputs of gates
    
    Keldysh Institute preprints, 2018, 033, 23 pp.
36. Synthesis of easily testable logic networks under one-type stuck-at faults at inputs and outputs of gates
    
    Intelligent systems. Theory and applications, 22:3 (2018),  131–147
37. Complete diagnostic length $2$ tests for logic networks under inverse faults of logic gates
    
    Trudy Mat. Inst. Steklova, 301 (2018),  219–224
38. On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
    
    Diskretn. Anal. Issled. Oper., 24:3 (2017),  80–103
39. On fault detection tests of contact break for contact circuits
    
    Diskr. Mat., 29:4 (2017),  66–86
40. Lower bounds for lengths of single tests for Boolean circuits
    
    Diskr. Mat., 29:2 (2017),  53–69
41. Complete diagnostic tests of the length two for logic networks under inverse faults of logic gates
    
    Keldysh Institute preprints, 2017, 105, 10 pp.
42. Complete fault detection tests of the length two for logic networks under stuck-at faults of gates
    
    Keldysh Institute preprints, 2017, 104, 16 pp.
43. Single fault detection tests for logic networks in the basis “conjunction-negation”
    
    Keldysh Institute preprints, 2017, 030, 31 pp.
44. Single fault detection tests for logic networks of AND, NOT gates
    
    Prikl. Diskr. Mat., 2017, no. 38,  66–88
45. Tests of contact closure for contact circuits
    
    Diskr. Mat., 28:1 (2016),  87–100
46. Lower bounds on lengths of single tests for logic circuits
    
    Keldysh Institute preprints, 2016, 139, 21 pp.
47. Lower bounds on lengths of complete diagnostic tests for circuits and inputs of circuits
    
    Keldysh Institute preprints, 2016, 060, 12 pp.
48. On single diagnostic tests for logic circuits in the Zhegalkin basis
    
    Keldysh Institute preprints, 2016, 050, 16 pp.
49. On tests of contact closure for contact circuits
    
    Keldysh Institute preprints, 2016, 014, 20 pp.
50. On single diagnostic tests for logic circuits in the Zhegalkin basis
    
    University proceedings. Volga region. Physical and mathematical sciences, 2016, no. 3,  3–18
51. Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits
    
    Prikl. Diskr. Mat., 2016, no. 4(34),  65–73
52. Estimations on lengths of tests of functional elements under a large number of permissible faults
    
    Diskretn. Anal. Issled. Oper., 22:5 (2015),  52–70
53. Single tests for logical gates
    
    Diskr. Mat., 27:2 (2015),  73–93
54. On an exact length value of a minimal single diagnostic test for one class of circuits
    
    Keldysh Institute preprints, 2015, 074, 20 pp.
55. Estimation of fault detection and diagnostic tests' length for contacts
    
    University proceedings. Volga region. Physical and mathematical sciences, 2015, no. 2,  108–121
56. Single tests for contacts
    
    Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2015, no. 5,  13–18
57. Estimates for lengths of check and diagnostic tests of functional elements
    
    Diskretn. Anal. Issled. Oper., 21:6 (2014),  73–89
58. Fault detection and diagnostic tests for logic gates
    
    Diskr. Mat., 26:2 (2014),  83–99
59. Check and diagnostic tests for AND, OR, and NOT gates
    
    Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2014, no. 6,  40–44
60. The diagnosis of states of contacts
    
    Diskr. Mat., 25:4 (2013),  30–40