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Sarkisyan S S
Publications in Math-Net.Ru
Raman measurement of the refractive silicon index during pulsed laser annealing
Pisma v Zhurnal Tekhnicheskoi Fiziki
,
12
:3 (1986),
175–179
Low-frequency stability of a YAG:Nd
3+
laser
Kvantovaya Elektronika
,
12
:7 (1985),
1548–1550
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Steklov Math. Inst. of RAS
, 2024