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ЖУРНАЛЫ // Письма в Журнал экспериментальной и теоретической физики // Архив

Письма в ЖЭТФ, 2002, том 76, выпуск 9, страницы 665–668 (Mi jetpl2972)

КОНДЕНСИРОВАННОЕ СОСТОЯНИЕ

Steps on current-voltage characteristics of a silicon quantum dot covered by natural oxide

S. V. Vyshenskiia, U. Zeitlerb, R. J. Haugb

a Nuclear Physics Institute, Moscow State University
b Institut für Festkörperphysik, Universität Hannover

Аннотация: Considering a double-barrier structure formed by a silicon quantum dot covered by natural oxide with two metallic terminals, we derive simple conditions for a step-like voltage-current curve. Due to standard chemical properties, doping phosphorus atoms located in a certain domain of the dot form geometrically parallel current channels. The height of the current step typically equals to (1.2 pA)$N$, where $N=0,1,2,3\ldots$ is the number of doping atoms inside the domain, and only negligibly depends on the actual position of the dopants. The found conditions are feasible in experimentally available structures.

PACS: 73.23.Ps, 73.23.Hk

Поступила в редакцию: 03.10.2002

Язык публикации: английский


 Англоязычная версия: Journal of Experimental and Theoretical Physics Letters, 2002, 76:9, 568–571

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