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ЖУРНАЛЫ // Mendeleev Communications // Архив

Mendeleev Commun., 2025, том 35, выпуск 6, страницы 688–691 (Mi mendc7317)

Communications

Methodology for the radiation hardness assessment of organic semiconductors

P. M. Kuznetsova, T. N. Khokhlovaa, G. A. Kichiginaa, P. P. Kushcha, D. P. Kirukhina, P. A. Troshinba

a Federal Research Center of Problems of Chemical Physics and Medicinal Chemistry, Russian Academy of Sciences, 142432 Chernogolovka, Moscow Region, Russian Federation
b Zhengzhou Research Institute, Harbin Institute of Technology, 450003 Zhengzhou, China


Аннотация: The first systematic study of the radiation hardness of a series of structurally similar conjugated polymers, model organic semiconductors, involves the set of numeric descriptors for quantitative benchmarking of their stability under exposure to the ionizing radiation. The conjugated polymers demonstrate surprisingly high radiation hardness and can tolerate huge doses of gamma rays up to 16 MGy much better than commodity types of plastic, which opens opportunities for their application in the development of radiation-tolerant organic electronics.

Ключевые слова: organic semiconductors, organic electronics, radiation hardness, gamma rays, aerospace applications.

Поступила в редакцию: 12.05.2025
Принята в печать: 26.06.2025

Язык публикации: английский

DOI: 10.71267/mencom.7820



© МИАН, 2025