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ЖУРНАЛЫ // Физика и техника полупроводников // Архив

Физика и техника полупроводников, 2015, том 49, выпуск 7, страницы 920–924 (Mi phts7334)

Эта публикация цитируется в 10 статьях

Спектроскопия, взаимодействие с излучениями

Properties of antimony doped ZnO thin films deposited by spray pyrolysis technique

N. Sadananda Kumar, Kasturi V. Bangera, G. K. Shivakumar

Thin Films Laboratory, Department of Physics, National Institute of Technology Karnataka, Surathkal, 575025 Mangalore, India

Аннотация: Antimony (Sb) doped zinc oxide (ZnO) thin films were deposited on the glass substrate at 450$^\circ$C using spray pyrolysis technique. Effect of Sb doping on surface morphology structural, optical and electrical properties were studied. X-ray diffraction (XRD) analysis showed that both the undoped and doped ZnO thin films are polycrystalline in nature with (101) preferred orientation. SEM analysis showed a change in surface morphology of Sb doped ZnO thin films. Doping results in a marked increase in conductivity without affecting the transmittance of the films. ZnO films prepared with 3 at% Sb shows the lowest resistivity of 0.185 $\Omega$ $\cdot$ cm with a Hall mobility of 54.05 cm$^2$V$^{-1}$s$^{-1}$, and a hole concentration of 6.25 $\times$ 10$^{17}$ cm$^{-3}$.

Поступила в редакцию: 18.09.2013
Принята в печать: 02.12.2014

Язык публикации: английский


 Англоязычная версия: Semiconductors, 2015, 49:7, 899–904

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